ELIAS

The world's highest spectral resolution commercial echelle spectrometer series with Littrow arrangement - for the spectral measurement of emission and absorption lines, particularly in excimer laser lithography.

  • Intensity dynamics of up to 4 orders of magnitude
  • Highest spectral resolution (2.5 million - 10 million)
  • Very high imaging quality
  • Simple and low-maintenance operation
  • Motorized optomechanics
ELIAS
Optical design Echelle monochromator in Littrow arrangement
Aperture ratio f/50

The ELIAS Emission Line Analyzing Spectrometer models belong to a worldwide unique monochromator series, with which a spectrally high-resolution quantitative measurement of narrowband laser lines with an intensity dynamic range of up to four orders of magnitude is possible. By using a CCD camera with a signal-to-noise ratio of up to 40,000, the line profiles can be detected simultaneously within their spectral environment. The patented optical design based on an echelle grating has an almost diffraction-limited imaging quality with a sufficiently high linear dispersion to be able to resolve the half-widths of the lines with 5 to 10 pixels at the typical pixel widths of the line detectors.

The use of a 360 mm wide echelle grating within a Littrow arrangement allows a single, double or even quadruple pass, depending on the ELIAS version. This allows either extremely precise line characterization with extremely high resolution or a larger inspection area analysis with reduced resolution and higher sensitivity. A camera focal length of 10 m is achieved with a 2.5 m offaxis paraboloid mirror and downstream anamorphic magnification optics with a tangential reproduction scale of 4:1.

The ELIAS spectrometers are thermally and mechanically extremely stable and have fully motorized optomechanics for automatic focusing and alignment of the spectrum to the detector. Chromatic aberrations are avoided by using reflective optics with broadband UV coatings. The radiation is coupled into the spectrometer via an SMA fiber or pure reflection transfer optics.

With the supplied Sophi software, all functions of the spectrometer-detector unit are controlled via an intuitive graphical user interface. A scan measurement mode enables the sequential measurement of a larger wavelength range than the spectrometer’s free spectral range. An optional LabVIEW library enables complete remote control of the ELIAS and thus integration into complex test stations.

The optical design of all models in the ELIAS series is identical to the standard ELIAS I version.

  • ELIAS I: Standard model of the ELIAS series.
  • ELIAS II: ELIAS model with a significantly higher spectral resolution, fast shutter and high-resolution, more strongly cooled detector system for improved time-resolved measurements with a higher signal-to-noise ratio.
  • ELIAS III: Further development of the ELIAS II with integrated reflector, which enables fourfold utilization of the echelle grating and thus a doubling of the spectral resolution of an ELIAS II.
  • ELIAS LD: Low Dispersion ELIAS model in which the half-widths of the lines are no longer resolved with 5 to 10 pixels. The free spectral range can thus be more than tripled without significantly reducing the spectral resolution compared to the ELIAS I.
  • WAVEMETER: ELIAS I model for determining the absolute wavelength 193 nm.
  • ELIAS VUV: Vacuum-encapsulated ELIAS I model for measuring F2 lasers with a wavelength of 157 nm.

Models

Specification ELIAS I / ELIAS VUV ELIAS II ELIAS III: ELIAS LD WAVEMETER
Basic specifications
Optical design Echelle monochromator in Littrow arrangement
Aperture ratio f/50 50 50 50 50
Slit width
Wavelength range
Spectral resolution FWHM
Accuracy of the wavelength dial better than ± 5 pm after calibration with internal mercury lamp better than ± 5 pm after calibration with internal mercury lamp better than ± 5 pm after calibration with internal mercury lamp better than ± 5 pm after calibration with internal mercury lamp better than ± 5 pm after calibration with internal mercury lamp
Simultaneous inspection area
Lineardispersion*
Dimensions without detector (L x W x H) 1.400 x 310 x 250 1.400 x 310 x 250 1.400 x 310 x 250 1.400 x 310 x 250 1.400 x 310 x 250
Weight without detector 50 kg 50 kg 50 kg 50 kg 50 kg
Special features
Detector & System
Detector CCD –1.024 px CCD –2.048 px CCD –2.048 px
Exposure time, min. 18 ms 2 ms 2 ms
Dynamic range 16-bit AD conversion, realistic approx. 33,000:1 16-bit AD conversion, realistic approx. 33,000:1 16-bit AD conversion, realistic approx. 33,000:1 16-bit AD conversion, realistic approx. 33,000:1 16-bit AD conversion, realistic approx. 33,000:1
Light injection
Wavelength calibration with internal mercury lamp (253.652 nm) with internal mercury lamp (253.652 nm) with internal mercury lamp (253.652 nm) with internal mercury lamp (253.652 nm) with internal mercury lamp (253.652 nm)
Control
Software Sophi, LabVIEW library optional Sophi, LabVIEW library optional Sophi, LabVIEW library optional Sophi, LabVIEW library optional Sophi, LabVIEW library optional

ELIAS

DEMON

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Spectra

Elias 1

Spectrum of ELIAS I at 193 nm, double structure with narrow, symmetrical peak. FWHM = 0.055 pm, SNR = 7104.
ELIAS I Laser spectrum @ 193 nm single pass
Spectrum of ELIAS I at 193 nm, double structure with narrow, symmetrical peak. FWHM = 0.055 pm, SNR = 7104.
ELIAS I Laser spectrum @ 193 nm double pass
ELIAS I spectrum of Hg with double structure, FWHM = 5,830 pm, SNR = 133.ELIAS I spectrum of Hg, single structure, FWHM = 6,138 pm, SNR = 1501.
ELIAS I Hg spectrum @ 253 nm single pass
Spectrum of a 632 nm light source with a narrow slit. High intensity, narrow line width (FWHM = 2.942 pm).
ELIAS I Hg spectrum @ 253 nm double pass

ELIAS II

Spectrum of the 193.6222862 nm emission line, measured with ELIAS 2. The FWHM is 0.041 pm and the SNR is 8459.
ELIAS II laser spectrum @ 193 nm double pass
Spectrum of the Hg emission line at 253.651194 nm, measured with ELIAS 2. The FWHM is 5.739 pm and the SNR is 142.
ELIAS II Hg spectrum @ 253 nm double pass

ELIAS III

Spectrum of an emission line at 193.623158 nm with ELIAS 3, showing a FWHM of 0.035 pm and a SNR of 22505.
ELIAS III laser spectrum @ 193 nm single pass
Spectrum of an emission line at 193.63089 nm with ELIAS 3, showing a FWHM of 0.021 pm and a SNR of 860.
ELIAS III laser spectrum @ 193 nm double pass
Spectrum of mercury (Hg) with ELIAS 3, showing a strong emission line at 253.6518 nm with FWHM of 5.128 pm.
ELIAS III Hg spectrum @ 253 nm

Applications

  • Excimer laser lithography
  • Measurement of the spectral and temporal stability of diode lasers, solid-state lasers and emission lines of lamps
  • Precise determination of the absolute wavelength
  • LIBS - laser-induced plasma spectroscopy

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